Central Laboratory Hosts SEM Technology Lecture: FIB-SEM & Low-Voltage High-Resolution Imaging

Lecture Info

The Central Laboratory (Analysis and Testing Center) will host an SEM technology lecture on May 29 (Friday) from 2:30–5:00 PM at the 1F Lecture Hall, High-Level Lab Building B.

Talk 1

Title: Seeing and Reshaping the Nanoworld — Thermo Fisher FIB-SEM Technology

Speaker: Luo Jun (Thermo Fisher Scientific EM Product Expert), graduate of Sun Yat-sen University, specializing in SEM application development.

FIB-SEM not only observes but also cuts, modifies, and reconstructs the nanoworld in 3D. The talk covers this combined high-resolution imaging and precision machining technology, along with SEM-FIB-XPS integration.

Talk 2

Title: Multi-Detector Low-Voltage High-Resolution Imaging

Speaker: Li Yingnan (Thermo Fisher Scientific Application Expert), with nearly 10 years of SEM experience.

The talk covers the value of low-voltage imaging for surface-sensitive resolution, characterization strategies using four detectors of the Apreo 2S, and optimized approaches for insulating and beam-sensitive materials.

Source: STU OA Notice (Central Laboratory, Analysis and Testing Center)